Mattinglyvaldez8426

Various process regimes were observed during microwelding of glass with bursts of ultrashort laser pulses. Two major welding regimes and various subregimes were identified for two different materials. The radiation emitted by the laser-induced plasma was used to monitor different regimes that characterize glass microwelding. A comprehensive understanding of the various process regimes can be exploited to use the regimes according to their specific advantages, especially for industrial applications.A hybrid model based on a wavelet threshold de-noising (WTD) and recursive feature elimination with cross-validation (RFECV) method was proposed to improve the measurements in quantitative analysis of coal properties using laser-induced breakdown spectroscopy (LIBS). First, a modified threshold of WTD was proposed based on wavelet coefficient theory. Interference of noise in the LIBS spectrum was reduced by using this modified method. Then, the RFECV method was applied to extract effective features from the de-noised LIBS spectrum. Finally, support vector regression (SVR) models of coal properties were established by the selected features. A validation set was used to verify the effectiveness and robustness of the hybrid model. The improvement of the hybrid model on the quantitative analysis of each index of coal properties (heat value, ash, volatile content) was studied and discussed. By using the proposed model, the determination coefficient (R2), root mean square error of prediction, average relative error, and relative standard deviation were all significantly improved over the original spectra model. The results demonstrated that the proposed model could effectively improve the accuracy and precision of LIBS quantitative analysis for coal properties.Laser guide star Shack-Hartmann wavefront sensor images on extremely large telescopes (ELT) will be significantly elongated due to the off-axis projection of the laser relative to the subapertures. The finite number of pixels of the wavefront sensor detector means the most elongated images will be truncated, introducing errors in the centroid measurements. In this paper, we propose appending to the truncated wavefront sensor image the most likely missing tails from a high-resolution nontruncated reference image, which can be calculated from all of the low-resolution images. Elacestrant in vitro We show, via numerical simulation, that we can improve the centroid estimate for the most elongated subapertures on an ELT in the presence of read and photon noise.The sampling rate and angular resolution of diffraction-based beam steering employing a digital micromirror device (DMD) can be simultaneously enhanced by at least an order of magnitude by synchronizing multiple nanosecond laser sources and pulses during each DMD actuation. A time-of-flight single-chip DMD lidar with three sources measures a range at a 3.34 kHz sampling rate and a 3.4° angular resolution across a 48° field of view. Employing multiple diffraction orders of the DMD improves the sampling rate at least by a factor of 2 and up to the number of diffraction orders supported by the DMD. An improved sampling rate of 6.68 kHz with a 9.6° angular resolution is experimentally demonstrated by illuminating micromirrors multiple times within a single transition period of the micromirrors.Wavefront coding is a technique that combines optical phase elements and digital signal processing in order to increase the effective depth of focus of optical systems. The success of wavefront coding lies in the design of a suitable phase mask placed at the system's aperture. This element allows for image formation invariant under the effects of different second-order optical aberrations. In optical systems limited by temporally or spatially varying high-order aberrations, the use of wavefront coding has not been fully demonstrated. Here we propose the choice of Jacobi-Fourier shaped phase masks to produce sharp and clear retinal images of living eyes. To demonstrate the potential use of the technique, we analyze the performance of the Jacobi-Fourier phase masks through experimental simulations to alleviate aberrations for different eye aberrations. We will show that the best mask choice is robust to noise while keeping acceptable resolution and reducing image artefacts.Electroluminescence (EL) imaging of Si-based photovoltaic (PV) modules is used widely to spatially detect and characterize electrical defects, including handling and degradation-induced cracking of the component Si cells that are associated with reductions in module performance. In the present study, a commercial polycrystalline silicon PV module was subjected to accelerated lifecycle test environmental conditions and examined as a function of environmental exposure time using EL imaging. The approach followed pixel intensity distributions over each individual PV cell and confirmed a positive correlation between module conversion efficiency and results of the image analysis. Overall, an average of a 2.5% reduction in normalized EL intensity was correlated to a 0.35% reduction in actual power conversion efficiency (or a 2.3% decrease in relative efficiency). The imaging analysis technique offers a rapid, unsupervised means to assess EL data in lieu of conventional visual interpretation.Imaging submicron fluorescent microspheres are the standard method for measuring resolution in multiphoton microscopy. However, when using high-energy pulsed lasers, photobleaching and heating of the solution medium may deteriorate the images, resulting in an inaccurate resolution measurement. Moreover, due to the weak higher-order response of fluorescent microspheres, measuring three-photon resolution using three-photon fluorescence (3PEF) and third-harmonic generation (THG) signals is more difficult. In this report, we demonstrate a methodology for complete characterization of multiphoton microscopes based on second- and third-harmonic generation signals from the sharp edge of GaAs wafers. This simple methodology, which we call the nonlinear knife-edge technique, provides fast and consistent lateral and axial resolution measurement with negligible photobleaching effect on semiconductor wafers. In addition, this technique provides information on the field curvature of the imaging system, and perhaps other distortions of the imaging system, adding greater capability compared to existing techniques.